Home link

Home

Contact Us link

Contact Us

E-Tech Solution Inc. - Equipment Technology Solution

PRODUCT

ETCH
- ETCHER
- ASHER
- STRIPPER
CVD
- CVD
- FURNACE
- EPI
- RTP
PVD
- PVD
- SPUTTER
METROLOGY
- METROLOGY
- INSPECTION
- OTHERS
LITHO(PHOTO)
- TRACK
- STEPPER
- SCANNER
- ALIGNER
- LASER
WET
- CMP
- WET STATION
- SPIN DRYER
- SCRUBBER
IMPLANTA
- IMPLANTA
- OTHERS
ETC
- OVEN
- PROBER
- TESTER
- OTHERS
PUMP
- DRY PUMP
- TURBO PUMP
- CRYO PUMP
RF
- GENERATOR
- RPS
- POWER SUPPLY
- MATCH
CHILLER
CHUCK
- HEATER
- ESC
ROBOT
VALVE
ETC
- MFC
- BARATRON
- OTHERS
Heater

METROLOGY LEICA INS-3000 Wafer Defect Inspection

Picture of 17

move the prev

move the next

CATEGORY : METROLOGY > OTHERS > OTHERS
STATUS : SOLD
MANUFACTURE : METROLOGY
MODEL : INS-3000
VINTAGE :
SERIAL NO : 198428
WAFER SIZE : 8
DESCRIPTION :
METROLOGY LEICA INS-3000 Wafer Defect Inspection SN. 198428 8"

GO TO RELATED PARTS

Similar Products:

NIKON Nexiv Microsco...

MODEL : VMZ-R3020

KLA INS3000(SN.1269)

MODEL : INS3000

HITACHI CV4000 SN:61...

MODEL : CV4000

AMAT SEMVISION G4 (S...

MODEL : SEMVISION G4

OPTI PROBE OP2600 (S...

MODEL : OP2600

OPTI PROBE OP2600 (S...

MODEL : OP2600

KLA P2 profiler (SN_...

MODEL : P 2

E-Tech Solution Inc.

COPYRIGHT© 2008 E-Tech Solution Inc. ALL Rights Reserved.

29-30, Yanghyeop-gil, Bogae-myeon, Anseong-si, Gyeonggi-do, Korea | TEL : 82-31-677-4975 | FAX : 82-31-677-4976